This paper describes a novel CMOS magnetic field sensor that can measure all three magnetic field components (Bx, By, and Bz) simultaneously at a single location. The sensor employs three groups of mutually orthogonal horizontal and vertical Hall-effect elements, each with dedicated biasing circuits and amplifiers. The field sensitive volume of the 3D sensor is very compact, only 100 x 100 μm2, which enables high spatial resolution. The use of CMOS technology ensures high angular accuracy and orthogonality of the three measurement axes. The sensor also employs a spinningcurrent technique that effectively mitigates issues such as offset, low-frequency noise, and planar Hall effect. The wide analog bandwidth from DC to 300 kHz and built-in temperature sensor make the sensor suitable for various applications, including 3D positioning sensors, proximity sensors, current sensors, and magnetometry. As an example, the paper discusses an application of the 3D sensor for improved adhesion control in inspection robots.

New IEC technical specifications, for the standardized assessment of the sheet resistance RS of monolayer graphene, recently published in June 2023 are here presented. These new standards of the series IEC TS 62607-6-xx describe protocols for the application of the contact methods i) in-line four point probe and ii) van der Pauw. The general IEC context of the main development steps for standards and and example of the scientific experiments used as input for the standard development are also presented.

This paper deals with the experimental characterization of an accurate phase measurement system using transmission lines as phase reference. In particular, the used prototype implementing the accurate phase measurement system is also described. The prototype characterization aims of assessing the repeatability of the phase measurement and identifying the systematic effects affecting them. Several transmission lines, priory characterized by means of a Vector Network Analyzer, have been used as phase references. The obtained results demonstrated the standard deviation increases with the sine-wave frequency, while systematic effects are clearly visible at 10 kHz and 100 kHz. The maximum obtained standard deviation at 10 MHz is 0.30 ◦ .

Magnetic measurements are vital to support European challenges in areas such as electric vehicles; health; power transformation and harvesting; clean, affordable and secure energy; information and sensor technology. However, only very few European NMIs have the capabilities to perform traceable measurements of all of the most important magnetic quantities. Consequently, the adoption of novel technologies and materials is hindered by the lack of local metrological expertise that research and development activities in academia and industry could exploit. A European project (TRaMM, 21SCP02), in the framework of the Small Collaborative Projects (SCP) call 2021, is transferring the expertise of INRIM (Italy) in the field of magnetic calibration and measurements to CEM (Spain) and NSAI (Ireland), and to interested stakeholders. An update on the training material is given, and new stakeholders are actively sought.

Current comparator bridges are nowadays widespread for the realisation of the resistance unit with the quantum Hall effect and of a midrange resistance scale in most national metrology institutes. Future quantum resistance standards, e.g. those based on novel device materials and tabletop dry cryostats, make the more achievable DC currrent comparator bridges (DCCs) the most viable alternative with respect to the more accurate but more expensive cryogenic current comparator bridges (CCCs). A calibration of the individual DCC ratios of interest by comparison with a reference CCC is a straightforward way to improve the DCC performances. The paper reports a calibration exercise on the ratio 12.9064 kΩ : 1 kΩ, chosen as a benchmark since 12.9064 kΩ is close to the quantized resistance value. A more complete dataset involving also decadal resistance ratios will be presented at the Conference, together with a full evaluation of the calibration uncertainty.