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G. Bernardinis, A. Centuori, U. Gatti, P. Malcovati, F. Maloberti
BAND-PASS SIGMA-DELTA MODULATOR WITH 5 MHZ BANDWIDTH AND 80 MHz IF

In this paper we present a sigma-delta modulator for wide-band base transceiver station receivers. The modulator, based on a four-path architecture, achieves an equivalent sampling frequency of 320 MHz, although the building blocks operate at only 80 MHz. The circuit in simulation achieves 94 dB signal-to-noise ratio with a signal bandwidth of 5 MHz centered around an intermediate frequency of 80 MHz. Behavioral simulations of the complete sigma-delta modulator, including the most important non-idealities, as well as transistor-level simulations of the most critical building blocks are reported.

G. Pasini, P. A. Traverso, D. Mirri, F. Filicori
TIME-DOMAIN EXPERIMENTAL CHARACTERIZATION OF NONLINEAR DYNAMIC EFFECTS IN S/H-ADC DEVICES

The input/output relationship of a Sample/Hold and Analogue-to-Digital Conversion device (S/H-ADC) can be described as the response of a non-linear system with memory. A general-purpose “black-box” behavioural approach, based on a modified Volterra representation, has been proposed by authors for the modelling of a wide class of non-linear dynamic systems and specifically applied to the characterization of S/H-ADCs. In this paper, the instrumentation set-up and the experimental procedure for the extraction of S/H-ADC model parameters are presented and a novel standard for the characterization of non-linear dynamic effects in this family of measurement systems is proposed.

P. Arpaia, P. Daponte, S. Rapuano
A STATE OF THE ART ON ADC MODELING

The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.

P. Daponte, R. Holcer, L. Horniak, L. Michaeli, S. Rapuano
USING AN INTERPOLATION METHOD FOR NOISE SHAPING IN A/D CONVERTERS

Digital post processing of output data is often used to enhance the ADC Effective Number Of Bits (ENOB). In particular, it can be used to partially recover ENOB restrictions caused by nonlinearities. The paper deals with advantages and disadvantages coming from the application of a proposed nonlinearity correction method based on the Bayes theorem. It allows the reduction of large scale errors in output signal by means of the use of dithering with low peakpeak voltage instead of a high amplitude one. The paper gives a brief description of the method. Then, the results of an experimental investigation carried out on actual ADC output data are presented and discussed.

Voicu Groza, Boris Dzerdz
FPGA BASED IMPLEMENTATION OF A PREDICTIVE FLOATING-POINT ANALOG-TO-DIGITAL CONVERTER

Floating Point Analog-to-Digital Converters (FP-ADC’s) were developed and used to quantize large dynamic range signals in applications where large signals need not be encoded with a precision greater than that required for small signals. Comparing floating-point with uniform quantization, it was shown that FP-ADC requires much smaller silicon area for the same dynamic range, but at the cost of doubling the conversion time.
To improve the resolution and speed of conversion of such an FP-ADC, a higher precision predictive floatingpoint architecture was conceived (PFP-ADC). The PFPADC consists of two parallel uniform A/D converters, a D/A converter, a fixed-gain amplifier and a subtraction circuit. The current subtrahend of the subtraction circuit is based on the previous sample acquisition, while the current minuend is the measured signal itself. Determination of mantissa and exponent occurs in parallel.
This paper presents the principle used to improve the resolution of FP-ADC quantized signals, and its proofof- concept FPGA based implementation. The resulting improved SNR that was achieved by using the proposed FP-ADC is better than that of other FP-ADCs, while the conversion time is shorter due to the use of prediction techniques and statistical characteristics of the measured signals.

Anna Domańska
THE EQUALITY OF QUANTIZATION WITH DITHER SIGNAL AND OVERSAMPLING FROM THE POINT OF VIEW OF THE CRITERION OF SNR

SNR is a characteristic of analog-to-digital (A/D) conversion. One of its applications is the valuation of the “effect” of the change of the resolution of A/D conversion. SNR may be improved by modifying the process of discretization in terms of time (sampling) and value (quantization).
The present article discusses the equality of these two types of modification from the point of view of the criterion of SNR.

Henrik Lundin, Mikael Skoglund, Peter Händel
A FRAMEWORK FOR EXTERNAL DYNAMIC COMPENSATION OF AD CONVERTERS

External correction of analog-to-digital converters is considered. First, a dynamic correction scheme is proposed to comprise bit-masking. Next, a framework for analyzing the effects of bit-reduced table indexing is derived. This framework is finally applied in an optimization problem for bit allocation in the bit mask of the introduced correction scheme.
Both the dynamic correction method and the optimization problem are exemplified with experimental AD data. The results indicate that the considered correction scheme is superior to static schemes, and that the choice of bit mask is crucial, motivating the analysis framework.

Jan Holub, Olli Aumala
DATA PROCESSING AND DITHER ENHANCEMENT OF ADC PARAMETERS – TRENDS, APPLICATIONS, LIMITS

There is no noise-free place on Earth. Most of noisy effects are undesirable and unwelcome, especially in measuring technology. However, there are some measuring methods and algorithms using noise for quality enhancement. These processes are usually called dithering. Basic ideas of these methods were partially assumed from audio and video signal processing many years ago. The field of dithering technologies in measurement became large in recent years.

Vladimir Haasz, Jaroslav Roztocil , Dominique Dallet, David Slepicka
COMPARISON OF PARAMETERS OF SYSTEMS USED FOR AD CONVERTERS AND MODULES TESTING

The paper presents results of ADC testing systems comparison between Laboratoire de microélectronique IXL, University Bordeaux and ADCM&T Laboratory, Dept. of Measurement of FEE CTU, Prague. The comparison was performed using transportable reference AD device designed and developed in FEE CTU.

E. Nunzi, P. Carbone, D. Petri
ESTIMATION OF DELTA–SIGMA CONVERTER SPECTRUM

Effects of the windowing process, widely investigated by the scientific literature for narrow–band components embedded in white noise, is not sufficiently detailed when signals are corrupted by colored noise. Such a phenomenon can heavily affect the spectral parameters estimation of the noisy signal. In this paper effects of the windowing on the output of analog–to–digital converters with ΔΣ topology, which present a spectrally shaped quantization noise, is analyzed. In particular, the spectral leakage of both narrow– and wide– band components is investigated and a criterion for choosing the most appropriate window for any given modulator resolution is given. The proposed analysis validates the use of the Hanning sequence as the optimum two term cosine window to be employed for characterizing low order ΔΣ modulators.

Page 738 of 936 Results 7371 - 7380 of 9356