Hiroaki Nishioka, Satoru Takahashi, Kiyoshi Takamasu
A SUPER-RESOLUTION MICROSCOPY WITH STANDING EVANESCENT LIGHT AND IMAGE RECONSTRUCTION METHOD

We propose a super-resolution microscopy that employs standing evanescent light illumination and image reconstruction method with successive approximation. Samples are illuminated with standing evanescent light, which is formed and shifted into different positions on the interface of total internal reflection (TIR). Scattering light emitted from the illuminated samples is detected through far-field imaging optics. We assume two hypotheses of linearity and incoherence about the scattering light. Then we reconstruct the sample distribution from scattering images and standing evanescent light intensity with successive approximation. We examined this microscopy with one-dimensional computer simulation and demonstrated that super resolution over the diffraction limit is achievable. The resolution power improves with shorter peak-to-peak distance of standing evanescent light and more cycles of the reconstruction calculation. As a possible resolution, two dot samples separated by 50 nm were resolved when the wavelength is 633 nm and the diffraction limit is 594 nm. With two-dimensional computer simulation, we were also able to resolve random dot samples in super resolution by using longitudinal and transversal standing evanescent light.

Salvador Echeverría-Villagómez, Mahdha Flores-Campos, Rita Pantoja-Lesso, Nadira Rodríguez-Damián, Benito Valgañón-Argueta
HUMAN RESOURCE AND KNOWLEDGE MANAGEMENT SYSTEM FOR COMPETENCES IN METROLOGY USING INFORMATION TECHNOLOGIES

This article presents a proposal for the development of a Knowledge management system for the management of Metrologic knowledge. It was conceived to solve the problematic detected at some metrological organizations in México. It shows the revision of some information about HR problems, Knowledge management and Technology of education tendencies. The system is under development in the time this paper was written, however it is considered pertinent to present this information as a strategy that could be adopted by any organization concerned with metrology and on the other hand it expected to be improved with the comments of other NMIs (National Measurement Institutes) experiences.

Dilhermando Augusto de Mello, Luciana A. Almeida Carvalho
"IT IS NOT FORBIDDEN TO DREAM… NOR TO COUNT TALES" METROLOGY EDUCATION FOR THE YOUTH

XVIII IMEKO World Congress presents the paper METROLOGY EDUCATION FOR THE YOUTH. The work addresses among one forms playful to present the metrology fundamentals and the main scientists who contributed with their discoveries, research and measurements, throughout the evolution of the human being and the technology.

André Roberto de Sousa, Ricardo Gonzáles, Sérgio Conejero
FORMA3D – AN EDUCATIONAL PROGRAM FOR THE QUALIFICATION OF TECHNICAL PERSON INVOLVED WITH COORDINATE METROLOGY IN BRAZIL

The fast dissemination of coordinate metrology in Brazil has not been followed by the necessary qualification of human resources. Because of its flexibility, complexity and great integration with the whole manufacturing system, Coordinate metrology demands an in depth qualification of the technical person. This paper describes an educational program developed by professionals from Universities and Industries in Brazil for the qualification of technical person involved with coordinate metrology. The program, called FORMA3D, has been active since 2004 with more than 100 3D Metrologists graduated. The motivations, the technical background, the pedagogical structure and the preliminary results are related in this paper.

M. Alvarez Prieto, J. Jiménez Chacón, I. Cortés Nodarse, N. Martínez Alfonso
SOME LATIN-AMERICAN EXPERIENCES CONCERNING TEACHING OF CHEMICAL METROLOGY

Some acquired experiences concerning the teaching of Chemical Metrology in Latin-America for almost fifteen years are presented. They include postgraduate and undergraduate activities developed in seven countries of this continent. The combination of theoretic and practical activities and the sequence of learning from metrological, statistical and chemometrical backgrounds up to practical activities in personal computers are basic and motivate the learning process. Care is taken in order to promote the metrological approach and thinking in Analytical Chemistry. The learning of computing techniques plays an important role, combining graphic and numerical techniques for data analysis. The role of examples during the teaching process is analyzed and recognized. The introduction of a general model of errors permits to approach different topics on a metrological basis. Similarly, linking of performance characteristics of analytical procedures and validation concepts is essential. The understanding of traceability prepares students for organizational actions. Proper understanding of interlaboratory studies is attained on a practical basis. The metrological approach of uncertainty based on the Theory of Errors permits to develop the topic. A better comprehension of written standards is obtained from practical examples. Undergraduate students acquire a basic metrological knowledge very well. Recommendations for undergraduate and postgraduate programs are pointed out.