Reliability estimation of Inertial Measurement units using Accelerated Life Test |
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| Marco Carratù, Marcantonio Catelani, Lorenzo Ciani, Gabriele Patrizi, Antonio Pietrosanto, Paolo Sommella |
- Abstract:
- In many different technological and industrial fields microelectronic device reliability is rising up as a fundamental aspect to consider during the design of diagnostic, optimization and control systems. Unexpected failures in diagnostic and control units could lead to a severe impact on the entire system/plant availability. Thus, reliability analysis must be carried out during the early phase of the design. MEMS (Micro-Electro-Mechanical Systems) based Inertial Measurement Units are widespread in diagnostic units to monitor acceleration, position and angular velocity of machinery. However, recent literature lack of a reliability estimation for this kind of devices. Thus, this paper proposes a measurement setup and a customized Accelerated Life Test plan for reliability estimation of a set of Inertial Measurement Units. A temperature-based stress test based on the HTOL (High Temperature Operating Life) protocol have been carried out to age the devices with the aim of obtaining a failure dataset. Results of the test have been used to predict device’s reliability.
- Keywords:
- Arrhenius; Accelerometer; Gyroscope; Reliability; Testing; Industry; Innovation and Infrastructure
- Download:
- IMEKO-TC10-2022-010.pdf
- DOI:
- 10.21014/tc10-2022.010
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Conference 2022
- Title:
18th IMEKO TC10 Conference "Measurement for Diagnostics, Optimisation and Control to Support Sustainability and Resilience"
- Place:
- Warsaw, POLAND
- Time:
- 26 September 2022 - 27 September 2022