DEVELOPING THE SIGMA-DELTA A-D FOR PRECISION DC&LF METROLOGY
John Pickering
Abstract:
Keywords:
ADC, sigma delta, metrology, precision
Download:
IMEKO-TC4-2002-043.pdf
DOI:
-
Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002
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