A SELF-TESTING APPROACH TO TESTING OF MIXED ANALOGDIGITAL MICROSYSTEMS BASED ON MICROCONTROLLERS

Zbigniew Czaja
Abstract:
A new approach based on the 4D method is proposed to self-testing of analog networks (circuits) of mixed analog-digital microsystems controlled by microcontrollers. It is characterised by simplicity and facility of the implementation of diagnosis algorithms in simple and popular microcontrollers. In the paper the creation of a fault dictionary and self-testing procedures of analog networks (single soft fault detection and localisation) for these microsystems are described.
Keywords:
self-testing, diagnosis methods, microsystems, microcontrollers
Download:
PWC-2003-TC4-066.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003