SIGNATURE ANALYSIS FOR MEMS PSEUDORANDOM TESTING USING NEURAL NETWORKS |
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| Lukáš Kupka, Emmanuel Simeu, Haralampos-G. Stratigopoulos, Libor Rufer, Salvador Mir, Olga Tumová |
- Abstract:
- The aim of this work is to develop a lowoverhead, low-cost built-in test for Micro Electro Mechanical Systems (MEMS). The proposed method relies on processing the Impulse Response (IR) through trained neural networks, in order to predict a set of MEMS performances, which are otherwise very expensive to measure using the conventional test approach. The use of neural networks allows us to employ a low-dimensional IR signature, which results in a compact built-in test. A MEMS structure combining electro-thermal excitation and piezoresistive sensing was chosen as our case study. A behavioral model of this structure was built using Matlab for the purpose of the experiment. The results demonstrate that the neural network predictions are in excellent agreement with the simulation results of the behavioral model.
- Keywords:
- MEMS testing, neural networks, feature selection
- Download:
- IMEKO-TC1-TC7-2008-042.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC7
- Event name:
- TC1 & TC7 Conference 2008
- Title:
12th IMEKO TC1 & TC7 Joint Symposium on "Man, Science & Measurement" (TC7)
- Place:
- Annecy, FRANCE
- Time:
- 03 September 2008 - 05 September 2008