EFFECTIVE ALGORITHMS FOR DYNAMIC QUALITY TESTS OF A/D CONVERTERS USING STEP-WISE APPROXIMATED MULTI-CYCLE SINE WAVE |
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| Raul Land |
- Abstract:
- When the step-wise approximated multi-cycle sine wave is used as the testing input signal for dynamic quality tests of the A/D converters, the effectiveness, accuracy, and the resolution of the chosen DFT analysis method depends on the proper choice of the method parameters. This paper deals with the theoretical problems of the analysis of the obtained output data of the A/D converter when the above mentioned input signal is applied. The basic principles of effective algorithms are outlined.
- Keywords:
- A/D converter, dynamic quality test, step-wise approximated sine wave, DFT analysis
- Download:
- IMEKO-TC4-2001-076.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2001
- Title:
11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Lisbon, PORTUGAL
- Time:
- 13 September 2001 - 14 September 2001