DATA PROCESSING AND DITHER ENHANCEMENT OF ADC PARAMETERS – TRENDS, APPLICATIONS, LIMITS

Jan Holub, Olli Aumala
Abstract:
There is no noise-free place on Earth. Most of noisy effects are undesirable and unwelcome, especially in measuring technology. However, there are some measuring methods and algorithms using noise for quality enhancement. These processes are usually called dithering. Basic ideas of these methods were partially assumed from audio and video signal processing many years ago. The field of dithering technologies in measurement became large in recent years.
Keywords:
dithering, ADC
Download:
IMEKO-TC4-2002-009.pdf
DOI:
-
Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002