NEW APPLICATIONS OF SHAPE DESIGNED COMPLEMENTARY SIGNALS FOR TESTING OF ANALOG SECTIONS IN ELECTRONIC EMBEDDED SYSTEMS |
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| Dariusz Zaleski, Bogdan Bartosinski, Romuald Zielonko |
- Abstract:
- The article concerns the implementation of shape designed complementary signals in BISTs used in mixed-signal embedded systems for testing of their analog sections. The essence of the proposed method is stimulation of the tested circuit with a complementary signal of a designed particular shape, whose parameters are matched to the nominal position of circuit transfer function poles. The paper presents results of simulation research and practical verification of the method in a microsystem based on an ADuC814 microcontroller.
- Keywords:
- electronic embedded systems, complementary signals, Built-In Self-Testers
- Download:
- IMEKO-TC1-TC7-2008-041.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC7
- Event name:
- TC1 & TC7 Conference 2008
- Title:
12th IMEKO TC1 & TC7 Joint Symposium on "Man, Science & Measurement" (TC7)
- Place:
- Annecy, FRANCE
- Time:
- 03 September 2008 - 05 September 2008