ESD Immunity Tests in System Designs

LucianToma, Alexandru Salceanu, Mihai Cretu
Abstract:
Soft errors as well as damage can be caused by ESD in electronic systems. Such effects have resulted in many problems with companies and customers incurring large costs. Effects on system immunity from printed wiring board layout will be covered and examples of field problems described. Suggestions on how to avoid such problems are given.
Download:
IMEKO-TC4-2007-113.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2007
Title:
XVth IMEKO TC4 International Symposium on Novelties in Electrical Measurements and Instrumentation (together with 12th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Iasi, ROMANIA
Time:
19 September 2007 - 21 September 2007