Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms
Pedro M. Ramos, Fernando M. Janeiro, Mouhaydine Tlemçani, A. Cruz Serra
Abstract:
In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for impedance magnitudes from 100 Ω up to 15 kΩ, phases in the ±90º range at 1 kHz measuring frequency with extremely good results.
Download:
IMEKO-TC4-2007-048.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2007
Title:
XVth IMEKO TC4 International Symposium on Novelties in Electrical Measurements and Instrumentation (together with 12th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Iasi, ROMANIA
Time:
19 September 2007 - 21 September 2007
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