ATOMIC FORCE MICROSCOPE PROBE CALIBRATION BY USE OF A COMMERCIAL PRECISION BALANCE |
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| M. S. Kim, I. M. Choi, Y. K. Park, D.I. Kang |
- Abstract:
- In this paper, we investigate the characteristics of commercial AFM cantilevers and force calibration cantilevers in the range of 10 nN ~ 1000 µN by use of a high precision balance with resolution of 1 nN and 1-D fine positioning stage. This document is a guideline to the authors of papers to be presented at the TC3 2005 conference. These directions are written in the format required for papers. We advise you to download these directions as a MS Word document and use it as the template for your paper because it contains all necessary formats and styles. Papers should be submitted before October 30, 2004. The paper must be written in English, and length is limited to 6 pages, including graphs, figures, reference list.
- Download:
- IMEKO-TC3-2005-025u.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC3
- Event name:
- Force, Mass and Torque Measurements
- Title:
- Theory and Applications in Laboratories and Industry
- Place:
- Cairo, EGYPT
- Time:
- 19 February 2005 - 23 February 2005