## AMCTM VI

**P. Ciarlini, M. G. Cox, F. Pavese and G. B. Rossi (Eds.): "Advanced Mathematical and Computational Tools in Metrology, vol. 6", Series on Advances in Mathematics for Applied Sciences, vol. 66, World Scientific, Singapore, 2004.**

### Table of Contents

Estimation of precision and uncertainty of a calibration artefact for CMMs, *S D Antunes, M A F Vicente*

Uncertainty in semi-qualitative testing, *W Bremser, W Haesselbarth*

Processing coherent anomalies on digitalised surfaces in wavelet domain, *P Ciarlini, M L Lo Cascio*

Least squares adjustement in the presence of discrepant data, *M G Cox, A B Forbes, J L Flowers, P M Harris*

Harmonisation of correlated calibration curves with an application to the analysis of natural gases, *M G Cox, S Kamvissis, M J T Milton, G Vargha*

Parametrised approximation estimatore for mixed noise distributions, *D P Jenkinson, J C Mason, A Crampton, M G Cox, A B Forbes, R Boudjeema*

Algorithms for the calibration of laser plane sensors on CMMs, *C Lartigue, P Bourdet, L Mathieu, C Mehdi-Souzani*

Statistical tools for metrology and testing: from data collection to decision making, *C Perruchet*

Metrology software for the expression of measurement results by direct calculation of probability distributions, *G B Rossi, F Crenna, M Codda*

Feasibility study of using bootstrap to compute the uncertainty contribution from few repeated measurements, *B R L Siebert, P Ciarlini*

Recursive and parallel algorithms for approximating surface data on a family of lines or curves, *G Allasia*

Process measurement impact on the verification uncertainty, *J Bachmann, J M Linares, S Aranda, J M Sprauel*

On the uncertainty of a calibrated instrument, *W Bich, F Pennecchi*

Automatic differentiation and its application in metrology, *R Boudjeema, M G Cox, A B Forbes, P M Harris*

Use of non-central probabilità distributions for data analysis in metrology, *A Chunovkina*

Implementation of a general least squares method in mass measurements, *J Hald, L Nielsen*

The GUM three design pattern for uncertainty software, *B D Hall*

Statistical hypotheses testing for phase transition identification in cryogenic thermometry, *D Ichim, I Peroni, F Sparasci*

The impact of entropy optimisation principles on the probability assignement to the measurement uncertainty, *G Iuculano, A Zanobini, G Pellegrini*

Stochastic processes for modellino and evaluating atomic clock behaviour, *G Panfilo, P Tavella, C Zucca*

Compound-modelling of metrological data series, *F Pavese*

Homotopic solution of EW-TLS problems, *M L Rastello, A Premoli*

Pooled data distributions: graphical and statistical tools for examining comparison referente values, *A G Steele, K D Hill, R J Douglas*

Numerical uncertainty evaluation for complex-values quantities: a case example, *L Callegaro, F Pennecchi, W Bich*

Bayesian approach to quantum states tomography, *S Castelletto, I P Degiovanni, ML Rastello, I Ruo Berchera*

Simulation of charge transfer in a tunnel junction: approaching the sub-e scale, *G E D’Errico*

Validation of calibration methods – a practical approach, *E Filipe*

Comparison of LS techniques for the linear approximation of data affected by heteroschedastic errors in both variable with uncertainty estimation, *D Ichim, P Ciarlini, F Pavese, A Premoli, M L Rastello*

Noise correction for surface measurements, *H Haitjema, M A A Morel*

Evaluation of uncertainty of standard platinum resistance thermometer at national laboratory level, *M J Korczynski, A Hetman, A Szmyrka-Grzebyk, P Fotowicz*

A new approach to the presentation of the result measurements in virtual instruments, *M J Korczynsk, A Hetman*

A Hybrid method for l1 approximation, *D Lei, J C Mason*

Interpolation equations for industrial platinum resistance thermometers , *P Marcarino, P P M Steur, A Merlone*

From the fixed point calibration to the certificate: a completely automated temperature laboratory, *A Merlone, P Marcarino, P P M Steur, R Dematteis*

A new off-line gain stabilisation method applied to alpha-particle spectrometry, *S Pommé, G Sibbens*

Development of software for ANOVA that can generate expressions of variance expectations, *H Tanaka, T Kamoshita, K Ehara*

Template matching in passive sonar recognition, *J L Terry, D A Turner, J C Mason*

Fast computational alternative to Monte Carlo simulation of an output distribution, *R D Willink and B D Hall*