## AMCTM II

**P. Ciarlini, M. G. Cox, F. Pavese and D. Richter (Eds.): "Advanced Mathematical Tools in Metrology, vol. 2", Series on Advances in Mathematics for Applied Sciences, vol. 40, World Scientific, Singapore, 1996.**

### Table of Contents

Performing measurements through correct metrologcal procedures, *E. Arri*

Constructing and solving mathematical models of measurement *M. G. Cox*

Relevant general-purpose mathematical and statistical software, *J. Du Croz*

Model Parametrisation, *A. B. Forbes*

The singular value decomposition, *G. H. Golub*

On the Numerical Solution of Cauchy singular integral equations. I – A survey of methods with computational aspects, *L. Gori*

On the Numerical Solution of Cauchy singular integral equations. II –A projector-splines method for solution, *L. Gori, E. Santi*

A tool to measure dependancies in data sequences, *B. Pompe*

Statistical problems in calibration design, *A. Bernieri, G. Betta, M. Dell'Isola*

The concept of the small displacement torsor in metrology, *P. Bourdet, L. Mathieu, C. Lartigue, A. Ballu*

Monitoring an industrial process: bootstrap estimation of the accuracy of quality parameters, *P. Ciarlini, A. Gigli, G. Regoliosi, L. Moiraghi, A. Montefusco*

The calibration of adsorbed dose standards for ionising radiation, *S. Duane*

Gaining information from measurement data, *C. Elster, H. Gross, D. Richter*

A comparison of methods used for the calculation of effective area in the calibration of pressure balances, *A. B. Forbes, P. M. Harris*

Iterative solution of least-squares problems applied to flatness and grid measurements, *H. Haitjema*

Reconstruction algorithms for optical tomography, *R. Model*

Numerical evaluation of special integrals with application to contact problems, *M. Morandi Cecchi, E. Pirozzi, G. Zavarise*

Debye functions in temperature metrology, *J. V. Nicholas*

A new approach to total least-squares techniques for metrological applications, *A. Premoli, M. L. Rastello, G. Cirrincione*

Characterization of 3D surface roughness, *P. J. Scott*

A new method and software-tool for the exact solution of complex dimensional measurement problems, *D. Sourlier, W. Gander*

The virtual CMM concept, *E. Trapet, F. Wäldele*

On the grouping rule for random samples, *E. Di Nardo, E. Pirozzi*

The "linear regression method" for optimal circle fitting, *A. Kwan, J.A. Brandon*

An analysis of statistical estimation methods used in high accuracy mass determination, *T. S. Leahy*

Description and measurement of transient ultrasound fields, S. Leeman, *A. J. Healey*

Algorithms for orthogonal fitting of lines and planes: a survey, *D. S. Zwick*