## AMCTM I

**P. Ciarlini, M. G. Cox, R. Monaco and F. Pavese (Eds.): "Advanced Mathematical Tools in Metrology, vol. 1", Series on Advances in Mathematics for Applied Sciences, vol. 16, World Scientific, Singapore, 1994, pp. 270.**

### Table of Contents

Survey on algorithms and metrology applications: discrete processes, *M. G. Cox*

Mathematical problems in metrology: modelling and solution methods, *N. Bellomo and L. Preziosi*

Solving linear models for data analysis on parallel computers, *I. Galligani*

Inference with the fuzzy logic, *G. Bortolan*

Semi-implicit numerical methods for convection–diffusion equations, *V. Casulli and E. Bertolazzi*

The finite elements technique: theory, procedures and applications, *T. Scapolla*

Approximation methods in curves and surfaces generation, *M. Morandi Cecchi*

Estimation problems in the field of dimensional metrology: methodology and experience, *E. Canuto*

Geometrical tolerance assessment problems, *B. P. Butler, A. B. Forbes and P. M. Harris*

Wave propagation in dissipative solids, *A. Morro*

Splines and Cauchy principal value integrals, *L. Gori*

Computer-aided solution of integral equations in measurements, *S. Denasi, A. Premoli and M. L. Rastello*

Applied modulo counting, *J. W. Müller*

Outlier-resistant methods for estimation and model fitting, *D. Vecchia and J. Splett*

Comparison calibrations in metrology: a survey, *W. Bich and P. Tavella*

Self-calibration with application to CMMs geometry error correction, *P. C. Cresto*

An introduction to spectral analysis and wavelets, *D. B. Percival*

Mathematical models for optimal filtering and forecasting in time series analysis, *F. Sacerdote*

Some mathematical problems in counting statistics, *J. W. Müller*

Performance of standards: intercomparison, treatment of correlations, detection of laboratory offsets and outliers, long-term assessment of an ensemble of standards, *R. B. Frenkel*

Non-parametric bootstrap with application to metrological data, *P. Ciarlini, G. Regoliosi and F. Pavese*

Validation of metrology reference software, *J. Kok*

Classification of mathematical software for metrology, *M. G. Cox*

Mathematical software for metrology: meeting the needs of the metrologist, *A. B. Forbes*

Software quality assurance in metrology, *D. Richter*

Simulation of the cooling phase of dynamic thermal conductivity experiments, *M. M. Cerimele, F. Pistella and J. Spisiak*

Evaluation of the relief errors as a function of parametrization errors in measuring sculptured surfaces, *V. J. Sanchez, B.G. Ruiz*

ARX: an optimal parametric stochastic filter, *A. Montefusco, C. Colli, and M. Maffé*