ADC CHARACTERIZATION BY DYNAMIC INTEGRAL NONLINEARITY

Samer Medawar, Peter Händel, Niclas Björsell, Magnus Jansson

Abstract

Wide band characterization of analog-digital converter integral nonlinearity (INL) based on parametric modeling and least-squares parameter fit is performed. In particular, the variations in the INL due to the frequency at the ADC stimuli are modeled. The INL is divided into two main entities describing the static and dynamic behavior of the ADC, respectively. The static component is modeled by a high code component (HCF) of piecewise linear segments centered around zero. A static low code (LCF) polynomial inherent to the INL data is added to the segments to describe the static part of the model. The INL dynamic part is modeled by an LCF polynomial. Method implementation is considered and is applied to 12-bit ADC data at 210 MSPS.

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IMEKO-IWADC-2008-023.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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