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The DX schema as a modular concept for metrological certificates and reports

Justin Jagieniak, Shan Lin, Moritz Jordan, Muhammed-Ali Demir, Lutz Doering, Thomas Engel, Wiebke Heeren, Jan Loewe, Shanna Schönhals, Siegfried Hackel
  • Abstract:
    The Digital Calibration Certificate (DCC) has been the first metrological quality-related document that has undergone a thorough analysis and requirements assessment process in order to develop a fully machine-actionable digital process that fulfills the requirements of ISO 17025. During this, still ongoing, process, the demand for a more modular approach to digital quality documents has become obvious. The paper introduces the DX schema, which is the conceptual basis for the future DCC version 4 and other digital certificates, reports, and documents related to metrology, conformity assessment, and a process-oriented digital quality infrastructure. In addition, the paper introduces some examples of digital certificates and reports which will potentially benefit from the DX.
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  • DOI:
    tc6-2025.050

Event details:

[EVENTDETAILS]
  • IMEKO TC:
    TC6
  • Event name:
    TC6 M4Dconf2025
  • Title:

    2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation

  • Place:
    Benevento, ITALY
  • Time:
    3 September 2025 - 5 September 2025