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Provenance information in metrological traceability: application and modeling
Ryan White, Julia Neumann, Jean-Laurent Hippolyte, Blair Hall, Thiago Menegotto
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Abstract:This paper proposes to use provenance information to describe processes in metrology. The PROV data model is used as an example to showcase a conceptual analysis about how to improve quality, reliability, and overall interoperability within cross-domain applications that are based on metrological timeline data. The conceptual analysis will be used as a foundation for further contributions to the topic of improving metrological traceability with provenance data models.
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DOI:tc6-2025.043
Event details:
[EVENTDETAILS]
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IMEKO TC:TC6
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Event name:TC6 M4Dconf2025
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Title:
2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation
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Place:Benevento, ITALY
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Time:3 September 2025 - 5 September 2025