PERFORMANCE TESTING OF LOGARITHMIC ANALOG-TO-DIGITAL CONVERTERS

• Abstract:

  This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of converters. Systematic test procedures have been applied to µ-law converters according to the G.711 standard, and to a new type of high-speed true logarithmic pipeline A/D converter. DNL and INL had been defined in the logarithmic domain to allow correct characterization of this class of converters.
• Keywords:

  Logarithmic converter, companding, µ-Law converter
• Download:

  IMEKO-TC4-2001-153.pdf
• DOI:

  _unreg_tc4-2001.153

Event details:

• IMEKO TC:

  TC4
• Event name:

  TC4 Symposium 2001
• Title:

  11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)

• Place:

  Lisbon, PORTUGAL
• Time:

  13 September 2001 - 14 September 2001