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MEASURING OF EFFECTIVE RESOLUTION OF Σ-Δ ADC

J. Holub, J. Vedral
  • Abstract:
    Measurement and testing methodology for Σ-Δ Analog-to-Digital converters with nominal resolution 16 (24) bits is presented. The dependancies of effective resolution on the first notch frequency and gain are given.
  • Keywords:
    ADC, testing, Σ-Δ modulation
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  • DOI:
    _unreg_wc-2000.624

Event details:

[EVENTDETAILS]
  • IMEKO TC:
  • Event name:
    XVI IMEKO World Congress
  • Title:

    Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

  • Place:
    Vienna, AUSTRIA
  • Time:
    25 September 2000 - 28 September 2000