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Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms

Pedro M. Ramos, Fernando M. Janeiro, Mouhaydine Tlemçani, A. Cruz Serra
  • Abstract:
    In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for impedance magnitudes from 100 Ω up to 15 kΩ, phases in the ±90º range at 1 kHz measuring frequency with extremely good results.
  • DOI:
    _unreg_tc4-2007.048

Event details:

[EVENTDETAILS]
  • IMEKO TC:
    TC4
  • Event name:
    TC4 Symposium 2007
  • Title:
    XVth IMEKO TC4 International Symposium on Novelties in Electrical Measurements and Instrumentation (together with 12th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Iasi, ROMANIA
  • Time:
    19 September 2007 - 21 September 2007