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Modeling and Simulation of a Wheatstone bridge Pressure Sensor in High Temperature with VHDL-AMS
Sahbi Baccar, Timothée Levi, Dominique Dallet, François Barbara
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Abstract:This paper presents a model of a Wheatstone bridge sensor in VHDL-AMS. This model is useful to take into account the temperature effect on the sensor accuracy. The model is developed on the basis of a resistor model. Simulations are performed for three different combinations of parameters values. They confirm the resistors mismatch effect on the sensor accuracy in high temperature (HT).
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Keywords:Wheatstone bridge, sensor, resistance, mismatch, high temperature, VHDL-AMS
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DOI:_unreg_tc4-2013.144
Event details:
[EVENTDETAILS]
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IMEKO TC:TC4
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Event name:TC4 Symposium 2013
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Title:19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
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Place:Barcelona, SPAIN
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Time:18 July 2013 - 19 July 2013