METROLOGICAL CHARACTERISATION OF TIME-FREQUENCY AND TIME-SCALE ANALYSERS

• Abstract:

  The coupled time-frequency and time–scale analysis are more and more applied in the most different fields, and they are becoming a standard component of the measurement chain. To properly design a measurement chain, the metrological characteristics of the processing has to be known as for all other components such as sensors and conditioners. On these premises a systematic investigation of the metrological properties of the processing techniques considered is carried out, by applying the analysers to a set of properly designed synthetic test signals and by evaluating the result through subjective judgement by a jury. Results of the investigation are presented, giving guidelines for application.
• Keywords:

  time-frequency analysis, wavelet analysis, metrological properties
• Download:

  IMEKO-WC-2000-TC7-P178.pdf
• DOI:

  _unreg_wc-2000.178

Event details:

• IMEKO TC:
• Event name:

  XVI IMEKO World Congress
• Title:

  Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

• Place:

  Vienna, AUSTRIA
• Time:

  25 September 2000 - 28 September 2000