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High Reliable DAQ for ADC On Line Testing

M. Catelani, E. Campani, M. Del Pistoia, R. Singuaroli, M. Mugnaini, A. Fort
  • Abstract:
    This paper describes a general purpose high reliable DAQ for widely used sensor families. The development of a system which allows performing fast multi-channel data acquisition and ACD testing by means of single and two tone tests grants high reliability.
  • Keywords:
    acquisition board performance, Two tone test, ADC characterization
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  • DOI:
    _unreg_iwadc-2003.34

Event details:

[EVENTDETAILS]
  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2003
  • Title:

    VIIIth IMEKO TC4 Workshop on ADC modelling and testing

  • Place:
    Perugia, ITALY
  • Time:
    8 September 2003 - 10 September 2003