ELECTRONIC CIRCUITS PARAMETRIC MEASUREMENT: A NEW APPROACH IN ELECTRICAL METROLOGY

• Abstract:

  The measurement of electrical quantities in electronic circuits is inscribed in the non-parametric world for a long time. Multimeters, Oscilloscope and Network Analysers are the preferred tools used by engineers. Parametric identification allows a new step in circuit characterization. This approach opens new perspectives in the process of electronic circuit’s design. The present paper presents a solution to the problem of parametric characterization. To allow the simulation and validation of the results a new simulation tool is also presented. The proposed simulation solution uses modified off-the-shelf standard software packages, integrates them closely, offering an expeditious way of bringing mathematical postprocessing power to a standard electronic simulation package, in the framework of circuit design and characterization or measurement.
• Keywords:

  Electronic Circuit characterization, simulation, parametric measurement
• Download:

  PWC-2003-TC4-099.pdf
• DOI:

  _unreg_wc-2003.TC4-099

Event details:

• IMEKO TC:
• Event name:

  XVII IMEKO World Congress
• Title:

  Metrology in the 3rd Millennium

• Place:

  Dubrovnik, CROATIA
• Time:

  22 June 2003 - 28 June 2003