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DEFLECTOMETRIC PROFILER WITH SMALL BEAM SIZE USING A COMMERCIALLY AVAILABLE AUTOCOLLIMATOR
Youichi Bitou, Yohan Kondo
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Abstract:The special resolution of the angle-based deflectometric surface profiler has been improved by introducing a novel null instrument. Proposed null instrument is simple, inexpensive, and has fast response time. High accuracy flatness measurement for low reflective surface has been successfully demonstrated with 1 mm laser beam spot size. The repeatability of the surface form measurement is better than ±0.6 nm.
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Keywords:flatness, metrological instrumentation, surface form measurement, deflectometry, autocollimator
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Download:
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DOI:_unreg_tc14-2014.03
Event details:
[EVENTDETAILS]
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IMEKO TC:TC14
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Event name:TC14 LMPMI Symposium 2014
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Title:
11th Symposium on Laser Metrology for Precision Measurement and Inspection in Industry
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Place:Tsukuba, JAPAN
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Time:3 September 2014 - 5 September 2014