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COMPARISON OF PARAMETERS OF SYSTEMS USED FOR AD CONVERTERS AND MODULES TESTING

Vladimir Haasz, Jaroslav Roztocil , Dominique Dallet, David Slepicka
  • Abstract:
    The paper presents results of ADC testing systems comparison between Laboratoire de microélectronique IXL, University Bordeaux and ADCM&T Laboratory, Dept. of Measurement of FEE CTU, Prague. The comparison was performed using transportable reference AD device designed and developed in FEE CTU.
  • Keywords:
    ADC testing, reference AD device, comparative measurement
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  • DOI:
    _unreg_tc4-2002.008

Event details:

[EVENTDETAILS]
  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002